Melanie Ooi

Head of Practice Pathway Engineering
Engineering
Location: Building 182, Room 3004

Publications

Kuang, Y.C., Rajan, A., Ooi, M.P.-L., & Demidenko, S.N. (2017). Measured Quantity Value Estimator for Multiplicative Nonlinear Measurement Models. IEEE Transactions on Instrumentation and Measurement (Vol. 66(4),7857051).

Tey, W.K., Kuang, Y.C., Ooi, M.P.-L., & Khoo, J.J. (2017). Automated quantification of renal interstitial fibrosis for computer-aided diagnosis: A comprehensive tissue structure segmentation method. Computer Methods and Programs in Biomedicine (Vol. 155).

Rajan, A., Vijayaraghavan, V., Ooi, M.P.-L., Garg, A., & Kuang, Y.C. (2017). A simulation-based probabilistic framework for lithium-ion battery modelling. Measurement: Journal of the International Measurement Confederation (Vol. 115).

Rajan, A., Garg, A., Vijayaraghavan, V., Kuang, Y.C., & Ooi, M.P.-L. (2017). Parameter optimization of polymer electrolyte membrane fuel cell using moment-based uncertainty evaluation technique. Journal of Energy Storage (Vol. 15).

Chew, M.T., Demidenko, S., Ooi, M.P.-L., & Kuang, Y.C. (2017). Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education. CIVEMSA, IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications.

Tran, V.Q., Chew, M.T., Demidenko, S., Kuang, Y.C., & Ooi, M. (2017). Simple signature verification sub-system for identity recognition. CIVEMSA, IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications.

Chang, T. K., Talei, A., Ooi, M. P-L., & Alaghmand, S. (2017). Choice of Inputs for Event-based Rainfall-Runoff Modeling by Data-driven techniques in a Catchment with Multiple Rainfall Stations - A Case Study of Sungai Kayu Ara. Journal of Hydrology (Vol. 545).

Rajan, A., Kuang, Y. C., Ooi, M. P-L., & Demidenko, S. (2016). Moment-based Measurement Uncertainty Evaluation for Reliability Analysis in Design Optimization. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Tey, W. K., Ooi, M. P-L., Kuang, Y. C., Khoo, J. J., & Demidenko, S. (2016). Automating Measurement of Renal Interstitial Fibrosis: Effect of Colour Spaces on Quantification. The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Sok, H. K., Ooi, M. P-L., & Kuang, Y. C. (2016). Multivariate Alternating Decision Trees. Pattern Recognition (Vol. 50).

Ooi, M. P-L. (2016). Among the challenges and future trends in I&M Future Trends in I&M. IEEE Instrumentation and Measurement Magazine (Vol. 19(5)).

Rajan, A., Ooi, M. P-L., Kuang, Y. C., & Demidenko, S. (2016). Efficient Analytical Moments for the Robustness Analysis in Design Optimisation. IET Journal of Engineering (Vol. 1(1)).
http://hdl.handle.net/10652/3784

Rajan, A., Ooi, M. P-L., Kuang, Y. C., & Demidenko, S. N. (2015). Analytical Standard Uncertainty Evaluation using Mellin Transform. IEEE Access (Vol. 3(2015)).

Sok, H. K., Ooi, M. P-L., & Kuang, Y. C. (2015). Sparse Alternating Decision Tree. Pattern Recognition Letters (Vol. 60-61).

Ooi, M. P-L., Rajan, A., Kuang, Y. C., & Demidenko, S. N. (2015). Benchmark Test Distributions for Expanded Uncertainty Evaluation Algorithms. , IEEE Transactions on Instrumentation and Measurement (Vol. 65(5)).

Kuang, Y. C., Ooi, M. P-L., Rajan, A., & Demidenko, S. (2015). Performance Comparison Between Expanded Uncertainty Evaluation Algorithms. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society, Pisa, Italy.

Abeysekera, S., Siew, N., Ooi, M. P-L., Kuang, Y. C., Hassan, S. S., & Demidenko, S. (2015). Digital Pathology: Identifying Spongiosis in Unstained Histopathology Specimen. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Akmeliawati, R., Bailey, D., Demidenko, S., Gamage, N., Khan, S., Kuang, Y. C., Ooi, M. P-L., & Gupta, G. S. (2014). Assistive technology for relieving communication lumber between hearing/speech impaired and hearing people. IEE The Journal of Engineering (Vol. 2014).
http://hdl.handle.net/10652/3785

Kuang, Y. C., Rajan, A., Ooi, M. P-L., & Ong, T. C. (2014). Standard Uncertainty Evaluation of Multivariate Polynomial. Measurement (Vol. 58(1)).

Tan, J. S., Chang, T. K., Ooi, M. P-L., Kuang, Y. C., Tan, C. P., & Kitahashi, T. (2014). Fast and Robust Zebrafish Segmentation and Detection Algorithm under Different Spectrum Conditions. Proceedings of The IEEE Sensors Application Symposium, Queenstown, New Zealand.

Abeysekera, S., Ooi, M. P-L., Kuang, Y. C., Tan, C. P., & Hassan, S. S. (2014). Detecting Spongiosis in Stained Histopathological Specimen using Multispectral Imaging and Machine Learning. Proceedings of The IEEE Sensors Application Symposium, Queenstown, New Zealand.

Rajan, A., Kuang, Y. C., Ooi, M. P-L., & Demidenko, S. (2014). Standard Uncertainty estimation on polynomial regression models. Proceedings of The IEEE Sensors Application Symposium, Queenstown, New Zealand.

Duong, N. M., Chew, M. T., Demidenko, S., Pham, Q. H., Ooi, M. P-L., & Kuang, Y. C. (2014). Vision inspection system for pharmaceuticals. Proceedings of The IEEE Sensors Application Symposium, Queenstown, New Zealand.

Ooi, M. P-L., Kuang, Y. C., Sok, H. K., Demidenko, S., Kleeman, L., & Chan, C. (2013). Defect Cluster Recognition System for Fabricated Semiconductor Wafers. Engineering Applications of Artificial Intelligence (Vol. 25(3)).

Ooi, M. P-L., Kuang, Y. C., Cheng, H., Sim, E. K. J., Demidenko, S., & Chan, C. (2013). Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. IEEE Design and Test of Computers (Vol. 30(5)).

Sok, H. K., Chowdhury, M. S., Ooi, M. P-L., Kuang, Y. C., & Demidenko, S. (2013). Using the ADTree for Feature Reduction through Knowledge Discovery. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Chong, K., Ooi, M. P-L., Chowdhury, M. S., & Kuang, Y. C. (2013). Distributed Human Detection on Mobile Platform. Proceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications, Kuala Lumpur.

Kuang, Y. C., Ooi, M. P-L., & Rajan, A. (2013). Analytic Standard Uncertainty Evaluation of Polynomial in Normal/Uniform Random Variables. Proceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications, Kuala Lumpur.

Guan, C. S., Kuang, Y. C., & Ooi, M. P-L. (2013). Throughput-driven condition-based maintenance for frequently reconfigured mass production equipment. The International Journal of Advanced Manufacturing Technology (Vol. 65(9-12)).

Chow, Z. S., Ooi, M. P-L., Kuang, Y. C., & Demidenko, S. (2012). Low-Cost Automatic Visual Inspection System for Media in Hard Disk Drive Mass Production. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Ong, T. C., Tee, M. T., Kuang, Y. C., & Ooi, M. P-L. (2012). Periodic Piecewise Linear Excitation and Analysis for ADC Measurement. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Ong, M. S., Kuang, Y. C., & Ooi, M. P-L. (2012). Multisine with Optimal Phase-Plane Uniformity for ADC Testing. IEEE Transactions on Instrumentation and Measurement (Vol. 61(3)).

Ong, M. S., Ooi, M. P-L., & Kuang, Y. C. (2012). Statistical Measures of Two Dimensional Point Set Uniformity. Computational Statistics and Data Analysis (Vol. 56(6)).

Leong, B. T. M., Low, S. M., & Ooi, M. P-L. (2012). Low-Cost Microcontroller-based Hover Control Design of a Quadcopter. Journal of Procedia Engineering (Vol. 41).

Ong, M. S., Kuang, Y. C., Ooi, M. P-L., Demidenko, S., & Liam, P. S. (2011). Optimal Dual-Tone Frequency Selection Algorithm for ADC Frequency Domain Dynamic Tests. IEEE Transactions on Instrumentation and Measurement (Vol. 60(5)).

Ooi, M. P-L., Sim, K. J., Kuan, Y. C., Demidenko, S., Kleeman, L., & Chan, C. (2011). Getting More from the Semiconductor Test: Data Mining with Defect Cluster Extraction. IEEE Transactions on Instrumentation and Measurement (Vol. 60(10)).

Chow, Z. S., Ooi, M. P-L., Demidenko, S., & Liam, P. S. (2011). Automated Visual Inspection System for Mass Production of Hard Disk Drive Media. Journal of Procedia Engineering (Vol. 41).

Liam, P. S., Kuang, Y. C., Ooi, M. P-L., Ong, M. S., & Yeoh, J. C. C. (2011). Performance Comparison of Various Multisines Excitation Signals in ADC Testing. Proceeding of 2011 IEEE International Symposium on Electronic Design, Test and Applications.

Guan, T., Kuang, Y. C., Ooi, M. P-L., Demidenko, S., Cheah, X. G., & Tan, Y. S. (2011). Data-driven Condition-based Maintenance of Test Handlers in Semiconductor Manufacturing. Proceeding of 2011 IEEE International Symposium on Electronic Design, Test and Applications.

Cheng, H., Ooi, M. P-L., Kuang, Y. C., Sim, E., Cheah, B., & Demidenko, S. (2011). Automatic Yield Management System for Semiconductor Production Test. Proceeding of 2011 IEEE International Symposium on Electronic Design, Test and Applications.

Cheng, H., Ooi, M. P-L., Kuang, Y. C., Sok, H. K., Demidenko, S., & Cheah, B. (2011). Outlier Distribution Detection Approach to Semiconductor Wafer Fabrication Process Monitoring. 3rd Asia Symposium & Exhibits on Quality Electronic Design (ASQED).

Nolan, L., Chew, M-T., Demidenko, S., & Ooi, M. P-L. (2010). Virtual Instrumentation Based IC Parametric Tester for Engineering Education. Proceedings of the Fifth IEEE International Symposium on Electronic Design, Test and Application, DELTA '10.

Ooi, M. P-L., Chan, C., Tee, W. J., Kuang, Y. C., Kleeman, L., & Demidenko, S. (2010). Fast and Accurate Automatic Defect Cluster Extraction for Semiconductor Wafers. Proceedings of the Fifth IEEE International Symposium on Electronic Design, Test and Application, DELTA '10.

Cheng, J. W., Ooi, M. P-L., Chan, C., Kuang, Y. C., & Demidenko, S. (2010). Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers. Proceedings of the Fifth IEEE International Symposium on Electronic Design, Test and Application, DELTA '10.

Ong, M. S., Kuang, Y. C., Ooi, M. P-L., Demidenko, S., Soo, K. T., & David, H. (2010). Optimal Frequency Selection Algorithm for ADC Frequency Domain Dynamic Tests. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Ooi, M. P-L., Sim, E., Kuang, Y. C., Kleeman, L., Chan, C., & Demidenko, S. (2010). Automatic Defect Cluster Extraction for Semiconductor Wafers. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Chowdhury, M. S., Kuang, Y. C., & Ooi, M. P-L. (2010). Fast and Accurate Human Detection for Video Applications using Edgelets. Proceeding of the 2010 International Conference on Computer Applications and Industrial Electronics.

Seah, S. Y., Ooi, M. P-L., Kuang, Y. C., See, C. S., Panchadcharam, S., & Demidenko, S. (2009). Combining ATE and Flying Probe In-Circuit Test Strategies for Test Load Board Verification and Test. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Loh, W. H., Kuang, Y. C., & Ooi, M. P-L. (2009). Hardware Design of Neural Network System State Observer. Proceeding of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Akmeliawati, R., Dadgostar, F., Demidenko, S., Kuang, Y. C., Messom, C., Ooi, M. P-L., Sarrafzadeh, A., & SenGupta, G. (2009). Towards Real-Time Sign Language Analysis via Markerless Gesture Tracking. Proceeding of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Ooi, M. P-L., Chan, C., Lee, S-L., Mohanan, A. A., Goh, L. Y., & Kuang, Y. C. (2009). Towards Identification of Latent Defects: Yield Mining using Defect Characteristic Model and Clustering. Proceedings of IEEE/SEMI® Advanced Semiconductor Manufacturing Conference.

Mohanan, A. A., Chan, C., & Ooi, M. P-L. (2009). Structured Database Standardisation Framework for Data Mining of Semiconductor Manufacturing Data. Proceedings of 1st Asia Symposium on Quality Electronic Design (ASQED).

Ooi, M. P-L., Kuang, Y. C., Tee, W. J., Mohanan, A. A., & Chan, C. (2009). Accurate Defect Cluster Detection and Localisation on Fabricated Semiconductor Wafers using Joint Count Statistics. Proceedings of 1st Asia Symposium on Quality Electronic Design (ASQED).

Tee, W. J., Ooi, M. P-L., Kuang, Y. C., & Chan, C. (2009). Defect Cluster Segmentation for CMOS Fabricated Wafers. Conference on Innovative Technologies in Intelligent Systems & Industrial Applications.

Ooi, M. P-L., Kuang, Y. C., Chan, C., & Demidenko, S. (2008). Predictive Die-Level Reliability-Yield Modeling for Deep Sub-Micron Devices. Proceedings of the Fourth IEEE International Symposium on Electronic Design, Test and Application.

Ooi, M. P-L., Chan, C., Lee, S-L., Chin, W. L., Goh, L. Y., Kuang, Y. C., & Demidenko, S. (2008). Critical Assessment of Die Level Predictor Models. Proceedings of IEEE International Electronic Manufacturing Technology Conference.

Ooi, M. P-L., Kassim, Z. A., & Demidenko, S. (2007). Shortening Burn-in Test: Application of HVST and Weibull Statistical Analysis. IEEE Transactions on Instrumentation and Measurement (Vol. 56(3)).

Akmeliawati, R., Ooi, M. P-L., & Kuang, Y. C. (2007). Real-Time Malaysian Sign Language Translation using Colour Segmentation and Neural Network. IEEE Instrumentations and Measurements Technology Conference.

Kuang, Y. C., & Ooi, M. P-L. (2007). A Faster and Cheaper Method of Implementing States Observers using Artificial Neural Networks. Proceedings of The IEEE Instrumentation and Measurement Technology Conference.

Kuang, Y. C., & Ooi, M. P-L. (2007). An Implementation of a Radial Basis Function Network States Observer. Proceedings of the International Conference on Intelligent & Advanced Systems 2007.

Ooi, M. P-L. (2006). Hardware Implementation for Face Detection on Xilinx Virtex-II FPGA using the Reversible Component Transformation Colour Space. Proceedings of the Third IEEE International Symposium on Electronic Design, Test and Application.

Zakaria, F., Kassim, Z. A., Ooi, M. P-L., & Demidenko, S. (2006). Reducing Burn-in Time through High Voltage Stress Test and Weibull Statistical Analysis. IEEE Design & Test of Computers (Vol. 23(2)).

Ooi, M. P-L., Kassim, Z. A., & Demidenko, S. (2005). Shortening Burn-In Test: Application of Weibull Statistical Analysis and HVST. Proceedings of the IEEE Instrumentations and Measurements Technology Conference (Vol. 1).

Zakaria, F., Ooi, M. P-L., Kassim, Z. A., & Demidenko, S. (2005). Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST. Proceedings of the 14th Asian Test Symposium.