Melanie Ooi

Head of Practice Pathway - Engineering
Engineering
Location: Building 182, Room 3004

Publications

Ooi, M. P-L. (2016). Among the challenges and future trends in I&M Future Trends in I&M. IEEE Instrumentation and Measurement Magazine (Vol. 19(5)).

Sok, H. K., Ooi, M. P-L., & Kuang, Y. C. (2016). Multivariate Alternating Decision Trees. Pattern Recognition (Vol. 50).

Tey, W. K., Ooi, M. P-L., Kuang, Y. C., Khoo, J. J., & Demidenko, S. (2016). Automating Measurement of Renal Interstitial Fibrosis: Effect of Colour Spaces on Quantification. The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Rajan, A., Kuang, Y. C., Ooi, M. P-L., & Demidenko, S. (2016). Moment-based Measurement Uncertainty Evaluation for Reliability Analysis in Design Optimization. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Rajan, A., Ooi, M. P-L., Kuang, Y. C., & Demidenko, S. (2016). Efficient Analytical Moments for the Robustness Analysis in Design Optimisation. IET Journal of Engineering (Vol. 1(1)).
http://hdl.handle.net/10652/3784

Kuang, Y. C., Ooi, M. P-L., Rajan, A., & Demidenko, S. (2015). Performance Comparison Between Expanded Uncertainty Evaluation Algorithms. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society, Pisa, Italy.

Ooi, M. P-L., Rajan, A., Kuang, Y. C., & Demidenko, S. N. (2015). Benchmark Test Distributions for Expanded Uncertainty Evaluation Algorithms. , IEEE Transactions on Instrumentation and Measurement (Vol. 65(5)).

Sok, H. K., Ooi, M. P-L., & Kuang, Y. C. (2015). Sparse Alternating Decision Tree. Pattern Recognition Letters (Vol. 60-61).

Rajan, A., Ooi, M. P-L., Kuang, Y. C., & Demidenko, S. N. (2015). Analytical Standard Uncertainty Evaluation using Mellin Transform. IEEE Access (Vol. 3(2015)).

Abeysekera, S., Siew, N., Ooi, M. P-L., Kuang, Y. C., Hassan, S. S., & Demidenko, S. (2015). Digital Pathology: Identifying Spongiosis in Unstained Histopathology Specimen. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Duong, N. M., Chew, M. T., Demidenko, S., Pham, Q. H., Ooi, M. P-L., & Kuang, Y. C. (2014). Vision inspection system for pharmaceuticals. Proceedings of The IEEE Sensors Application Symposium, Queenstown, New Zealand.

Rajan, A., Kuang, Y. C., Ooi, M. P-L., & Demidenko, S. (2014). Standard Uncertainty estimation on polynomial regression models. Proceedings of The IEEE Sensors Application Symposium, Queenstown, New Zealand.

Abeysekera, S., Ooi, M. P-L., Kuang, Y. C., Tan, C. P., & Hassan, S. S. (2014). Detecting Spongiosis in Stained Histopathological Specimen using Multispectral Imaging and Machine Learning. Proceedings of The IEEE Sensors Application Symposium, Queenstown, New Zealand.

Tan, J. S., Chang, T. K., Ooi, M. P-L., Kuang, Y. C., Tan, C. P., & Kitahashi, T. (2014). Fast and Robust Zebrafish Segmentation and Detection Algorithm under Different Spectrum Conditions. Proceedings of The IEEE Sensors Application Symposium, Queenstown, New Zealand.

Kuang, Y. C., Rajan, A., Ooi, M. P-L., & Ong, T. C. (2014). Standard Uncertainty Evaluation of Multivariate Polynomial. Measurement (Vol. 58(1)).

Akmeliawati, R., Bailey, D., Demidenko, S., Gamage, N., Khan, S., Kuang, Y. C., Ooi, M. P-L., & Gupta, G. S. (2014). Assistive technology for relieving communication lumber between hearing/speech impaired and hearing people. IEE The Journal of Engineering (Vol. 2014).
http://hdl.handle.net/10652/3785

Kuang, Y. C., Ooi, M. P-L., & Rajan, A. (2013). Analytic Standard Uncertainty Evaluation of Polynomial in Normal/Uniform Random Variables. Proceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications, Kuala Lumpur.

Chong, K., Ooi, M. P-L., Chowdhury, M. S., & Kuang, Y. C. (2013). Distributed Human Detection on Mobile Platform. Proceedings of the IEEE International Conference on Smart Instrumentation, Measurement and Applications, Kuala Lumpur.

Sok, H. K., Chowdhury, M. S., Ooi, M. P-L., Kuang, Y. C., & Demidenko, S. (2013). Using the ADTree for Feature Reduction through Knowledge Discovery. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Ooi, M. P-L., Kuang, Y. C., Cheng, H., Sim, E. K. J., Demidenko, S., & Chan, C. (2013). Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. IEEE Design and Test of Computers (Vol. 30(5)).

Ooi, M. P-L., Kuang, Y. C., Sok, H. K., Demidenko, S., Kleeman, L., & Chan, C. (2013). Defect Cluster Recognition System for Fabricated Semiconductor Wafers. Engineering Applications of Artificial Intelligence (Vol. 25(3)).

Leong, B. T. M., Low, S. M., & Ooi, M. P-L. (2012). Low-Cost Microcontroller-based Hover Control Design of a Quadcopter. Journal of Procedia Engineering (Vol. 41).

Ong, M. S., Ooi, M. P-L., & Kuang, Y. C. (2012). Statistical Measures of Two Dimensional Point Set Uniformity. Computational Statistics and Data Analysis (Vol. 56(6)).

Ong, M. S., Kuang, Y. C., & Ooi, M. P-L. (2012). Multisine with Optimal Phase-Plane Uniformity for ADC Testing. IEEE Transactions on Instrumentation and Measurement (Vol. 61(3)).

Ong, T. C., Tee, M. T., Kuang, Y. C., & Ooi, M. P-L. (2012). Periodic Piecewise Linear Excitation and Analysis for ADC Measurement. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Chow, Z. S., Ooi, M. P-L., Kuang, Y. C., & Demidenko, S. (2012). Low-Cost Automatic Visual Inspection System for Media in Hard Disk Drive Mass Production. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Cheng, H., Ooi, M. P-L., Kuang, Y. C., Sok, H. K., Demidenko, S., & Cheah, B. (2011). Outlier Distribution Detection Approach to Semiconductor Wafer Fabrication Process Monitoring. 3rd Asia Symposium & Exhibits on Quality Electronic Design (ASQED).

Cheng, H., Ooi, M. P-L., Kuang, Y. C., Sim, E., Cheah, B., & Demidenko, S. (2011). Automatic Yield Management System for Semiconductor Production Test. Proceeding of 2011 IEEE International Symposium on Electronic Design, Test and Applications.

Guan, T., Kuang, Y. C., Ooi, M. P-L., Demidenko, S., Cheah, X. G., & Tan, Y. S. (2011). Data-driven Condition-based Maintenance of Test Handlers in Semiconductor Manufacturing. Proceeding of 2011 IEEE International Symposium on Electronic Design, Test and Applications.

Liam, P. S., Kuang, Y. C., Ooi, M. P-L., Ong, M. S., & Yeoh, J. C. C. (2011). Performance Comparison of Various Multisines Excitation Signals in ADC Testing. Proceeding of 2011 IEEE International Symposium on Electronic Design, Test and Applications.

Chow, Z. S., Ooi, M. P-L., Demidenko, S., & Liam, P. S. (2011). Automated Visual Inspection System for Mass Production of Hard Disk Drive Media. Journal of Procedia Engineering (Vol. 41).

Ooi, M. P-L., Sim, K. J., Kuan, Y. C., Demidenko, S., Kleeman, L., & Chan, C. (2011). Getting More from the Semiconductor Test: Data Mining with Defect Cluster Extraction. IEEE Transactions on Instrumentation and Measurement (Vol. 60(10)).

Ong, M. S., Kuang, Y. C., Ooi, M. P-L., Demidenko, S., & Liam, P. S. (2011). Optimal Dual-Tone Frequency Selection Algorithm for ADC Frequency Domain Dynamic Tests. IEEE Transactions on Instrumentation and Measurement (Vol. 60(5)).

Chowdhury, M. S., Kuang, Y. C., & Ooi, M. P-L. (2010). Fast and Accurate Human Detection for Video Applications using Edgelets. Proceeding of the 2010 International Conference on Computer Applications and Industrial Electronics.

Ooi, M. P-L., Sim, E., Kuang, Y. C., Kleeman, L., Chan, C., & Demidenko, S. (2010). Automatic Defect Cluster Extraction for Semiconductor Wafers. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Ong, M. S., Kuang, Y. C., Ooi, M. P-L., Demidenko, S., Soo, K. T., & David, H. (2010). Optimal Frequency Selection Algorithm for ADC Frequency Domain Dynamic Tests. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Cheng, J. W., Ooi, M. P-L., Chan, C., Kuang, Y. C., & Demidenko, S. (2010). Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers. Proceedings of the Fifth IEEE International Symposium on Electronic Design, Test and Application, DELTA '10.

Ooi, M. P-L., Chan, C., Tee, W. J., Kuang, Y. C., Kleeman, L., & Demidenko, S. (2010). Fast and Accurate Automatic Defect Cluster Extraction for Semiconductor Wafers. Proceedings of the Fifth IEEE International Symposium on Electronic Design, Test and Application, DELTA '10.

Nolan, L., Chew, M-T., Demidenko, S., & Ooi, M. P-L. (2010). Virtual Instrumentation Based IC Parametric Tester for Engineering Education. Proceedings of the Fifth IEEE International Symposium on Electronic Design, Test and Application, DELTA '10.

Tee, W. J., Ooi, M. P-L., Kuang, Y. C., & Chan, C. (2009). Defect Cluster Segmentation for CMOS Fabricated Wafers. Conference on Innovative Technologies in Intelligent Systems & Industrial Applications.

Ooi, M. P-L., Kuang, Y. C., Tee, W. J., Mohanan, A. A., & Chan, C. (2009). Accurate Defect Cluster Detection and Localisation on Fabricated Semiconductor Wafers using Joint Count Statistics. Proceedings of 1st Asia Symposium on Quality Electronic Design (ASQED).

Mohanan, A. A., Chan, C., & Ooi, M. P-L. (2009). Structured Database Standardisation Framework for Data Mining of Semiconductor Manufacturing Data. Proceedings of 1st Asia Symposium on Quality Electronic Design (ASQED).

Ooi, M. P-L., Chan, C., Lee, S-L., Mohanan, A. A., Goh, L. Y., & Kuang, Y. C. (2009). Towards Identification of Latent Defects: Yield Mining using Defect Characteristic Model and Clustering. Proceedings of IEEE/SEMI® Advanced Semiconductor Manufacturing Conference.

Akmeliawati, R., Dadgostar, F., Demidenko, S., Kuang, Y. C., Messom, C., Ooi, M. P-L., Sarrafzadeh, A., & SenGupta, G. (2009). Towards Real-Time Sign Language Analysis via Markerless Gesture Tracking. Proceeding of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Loh, W. H., Kuang, Y. C., & Ooi, M. P-L. (2009). Hardware Design of Neural Network System State Observer. Proceeding of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Seah, S. Y., Ooi, M. P-L., Kuang, Y. C., See, C. S., Panchadcharam, S., & Demidenko, S. (2009). Combining ATE and Flying Probe In-Circuit Test Strategies for Test Load Board Verification and Test. Proceedings of The IEEE Instrumentation and Measurement Technology Conference, IEEE I&M Society.

Ooi, M. P-L., Chan, C., Lee, S-L., Chin, W. L., Goh, L. Y., Kuang, Y. C., & Demidenko, S. (2008). Critical Assessment of Die Level Predictor Models. Proceedings of IEEE International Electronic Manufacturing Technology Conference.

Ooi, M. P-L., Kuang, Y. C., Chan, C., & Demidenko, S. (2008). Predictive Die-Level Reliability-Yield Modeling for Deep Sub-Micron Devices. Proceedings of the Fourth IEEE International Symposium on Electronic Design, Test and Application.

Kuang, Y. C., & Ooi, M. P-L. (2007). An Implementation of a Radial Basis Function Network States Observer. Proceedings of the International Conference on Intelligent & Advanced Systems 2007.

Kuang, Y. C., & Ooi, M. P-L. (2007). A Faster and Cheaper Method of Implementing States Observers using Artificial Neural Networks. Proceedings of The IEEE Instrumentation and Measurement Technology Conference.

Akmeliawati, R., Ooi, M. P-L., & Kuang, Y. C. (2007). Real-Time Malaysian Sign Language Translation using Colour Segmentation and Neural Network. IEEE Instrumentations and Measurements Technology Conference.

Ooi, M. P-L., Kassim, Z. A., & Demidenko, S. (2007). Shortening Burn-in Test: Application of HVST and Weibull Statistical Analysis. IEEE Transactions on Instrumentation and Measurement (Vol. 56(3)).

Zakaria, F., Kassim, Z. A., Ooi, M. P-L., & Demidenko, S. (2006). Reducing Burn-in Time through High Voltage Stress Test and Weibull Statistical Analysis. IEEE Design & Test of Computers (Vol. 23(2)).

Ooi, M. P-L. (2006). Hardware Implementation for Face Detection on Xilinx Virtex-II FPGA using the Reversible Component Transformation Colour Space. Proceedings of the Third IEEE International Symposium on Electronic Design, Test and Application.

Zakaria, F., Ooi, M. P-L., Kassim, Z. A., & Demidenko, S. (2005). Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST. Proceedings of the 14th Asian Test Symposium.

Ooi, M. P-L., Kassim, Z. A., & Demidenko, S. (2005). Shortening Burn-In Test: Application of Weibull Statistical Analysis and HVST. Proceedings of the IEEE Instrumentations and Measurements Technology Conference (Vol. 1).